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dc.contributor.authorArosa Lobato, Yago
dc.contributor.authorLópez Lago, María Elena
dc.contributor.authorFuente Carballo, Raúl de la
dc.date.accessioned2018-10-29T14:11:43Z
dc.date.available2018-10-29T14:11:43Z
dc.date.issued2018
dc.identifier.citationArosa, Y., Lago, E., & de la Fuente, R. (2018). Refractive index measurements in absorbing media with white light spectral interferometry. Optics Express, 26(6), 7578. doi: 10.1364/oe.26.007578
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/10347/17634
dc.description.abstractWhite light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range of 400–1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and, accordingly, on the measurement of the refractive index. Further, we show that the refractive index in the absorption band can be retrieved by a two-step process. The procedure requires the use of two samples of different thickness, the thicker one to retrieve the refractive index in the transparent region and the thinnest to obtain the data in the absorption region. First, the refractive index values are retrieved with good accuracy in the transparent region of the material for 1-mm-thick samples. Second, these refractive index values serve also to precisely calculate the thickness of a thinner sample (~150 µm) since the accuracy of the methods depends strongly on the thickness of the sample. Finally, the refractive index is recovered for the entire spectral range
dc.description.sponsorshipMinisterio de Economía y Competitividad (MINECO) (MAT2014-57943-C3-2-P, MAT2017-89239-C2-1-P); Xunta de Galicia and ERDF (AGRU 2015/11, GRC ED431C 2016/001 and ED431D 2017/06)
dc.language.isoeng
dc.publisherOSA Publishing
dc.rights© 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement (https://www.osapublishing.org/library/license_v1.cfm#VOR-OA)
dc.titleRefractive index measurements in absorbing media with white light spectral interferometry
dc.typeinfo:eu-repo/semantics/article
dc.identifier.DOI10.1364/OE.26.007578
dc.relation.publisherversionhttps://doi.org/10.1364/OE.26.007578
dc.type.versioninfo:eu-repo/semantics/publishedVersion
dc.rights.accessrightsinfo:eu-repo/semantics/openAccess
dc.contributor.affiliationUniversidade de Santiago de Compostela. Departamento de Física Aplicada
dc.contributor.affiliationUniversidade de Santiago de Compostela. Departamento de Física de Partículas
dc.description.peerreviewedSI


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