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dc.contributor.authorVázquez Ramallo, Manuel
dc.date.accessioned2020-05-04T12:20:17Z
dc.date.available2020-05-04T12:20:17Z
dc.date.issued2013
dc.identifier.citationRamallo, M.V. An effective-charge model for the trapping of impurities of fluids in channels with nanostructured walls. Nanoscale Res. Lett. 8, 19 (2013)
dc.identifier.issn1931-7573
dc.identifier.urihttp://hdl.handle.net/10347/21997
dc.description.abstractWe present model equations for the trapping and accumulation of particles in a cylindrical channel with nanostructured inner walls when a fluid passes through, carrying a moderate load of impurities. The basic ingredient of the model is the introduction of a phenomenological ‘effective-charge density’ of the walls, related to the electrical charges exposed in the nanotexture. The effective charge is gradually reduced as the flow runs through the channel and the trapped impurities cover the internal walls. Based on the proposed equations, the position and time dependence of the areal density of trapped impurities, and the filtration performance, may be calculated. It is proposed that experimentally testing these results may help to understand the enhanced trapping capability observed in many diverse nanotextured channel structures.
dc.description.sponsorshipThis work has been supported by the MICINN project FIS2010-19807 and by the Xunta de Galicia 2010/XA043 and 10TMT206012PR projects. All projects are co-funded by ERDF from the European Union
dc.language.isoeng
dc.publisherSpringer
dc.rights© 2013 Ramallo; licensee Springer. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited
dc.rights.urihttps://creativecommons.org/licenses/by/2.0/
dc.subjectNanostructures embedded in larger systems
dc.subjectFluid impurity trapping in nanostructures
dc.subjectEffective-charge density
dc.titleAn effective-charge model for the trapping of impurities of fluids in channels with nanostructured walls
dc.typejournal article
dc.identifier.doi10.1186/1556-276X-8-19
dc.relation.publisherversionhttps://doi.org/10.1186/1556-276X-8-19
dc.type.hasVersionVoR
dc.identifier.essn1556-276X
dc.rights.accessRightsopen access
dc.contributor.affiliationUniversidade de Santiago de Compostela. Departamento de Física de Partículas
dc.description.peerreviewedSI


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© 2013 Ramallo; licensee Springer. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited
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 © 2013 Ramallo; licensee Springer. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited





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